Tracking oxygen vacancy migration in memristor devices using operando hard X-ray photoelectron spectroscopy
利用原位硬X射线光电子能谱追踪忆阻器器件中的氧空位迁移
期刊:Scientific Reports
影响因子:3.9
doi:10.1038/s41598-025-30246-4
Capocasa, F; Rumaiz, A K; Weiland, C; Goul, R; Marshall, A; Harding, I; Ozbay, A; Kuczewski, A J; Karmakar, S; Boukhicha, M; Miryala, S; Carini, G A; Siddons, D P; Woicik, J C; Wu, J Z