A standardized approach to characterize hysteresis in 2D-materials-based transistors for stability benchmarking and performance projection
一种用于表征二维材料晶体管迟滞现象的标准化方法，可用于稳定性基准测试和性能预测。
期刊:Nature Communications
影响因子:15.7
doi:10.1038/s41467-025-66210-z
Karl, Alexander; Verdianu, Axel; Waldhoer, Dominic; Knobloch, Theresia; Kurzweil, Joël; Bahrami, Mina; Davoudi, Mohammad Rasool; Khakbaz, Pedram; Stampfer, Bernhard; Sattari-Esfahlan, Seyed Mehdi; Illarionov, Yury; Nazir, Aftab; Liu, Changze; Zheng, Yu; Pettorosso, Lorenzo; Polyushkin, Dmitry; Müller, Thomas; Das, Saptarshi; Wang, Xiao Renshaw; Tang, Junchuan; Zhang, Yichi; Tan, Congwei; Li, Ye; Peng, Hailin; Waltl, Michael; Grasser, Tibor
