Structural and Electrical Response of Emerging Memories Exposed to Heavy Ion Radiation
暴露于重离子辐射下的新兴存储器的结构和电学响应
期刊:ACS Nano
影响因子:16
doi:10.1021/acsnano.2c04841
Vogel, Tobias; Zintler, Alexander; Kaiser, Nico; Guillaume, Nicolas; Lefèvre, Gauthier; Lederer, Maximilian; Serra, Anna Lisa; Piros, Eszter; Kim, Taewook; Schreyer, Philipp; Winkler, Robert; Nasiou, Déspina; Olivo, Ricardo Revello; Ali, Tarek; Lehninger, David; Arzumanov, Alexey; Charpin-Nicolle, Christelle; Bourgeois, Guillaume; Grenouillet, Laurent; Cyrille, Marie-Claire; Navarro, Gabriele; Seidel, Konrad; Kämpfe, Thomas; Petzold, Stefan; Trautmann, Christina; Molina-Luna, Leopoldo; Alff, Lambert