High-Resolution Atomic Magnetometer-Based Imaging of Integrated Circuits and Batteries
基于高分辨率原子磁力计的集成电路和电池成像
期刊:IEEE Transactions on Instrumentation and Measurement
影响因子:5.9
doi:10.1109/tim.2026.3664381
Hunter, Dominic; Mrozowski, Marcin S; Ingleby, Stuart J; Read, Timothy S; McWilliam, Allan P; McGilligan, James P; Bauer, Ralf; Schwindt, Peter D D; Griffin, Paul F; Riis, Erling