Reflected Inline Detection in Epi Oblique Plane Microscopy
反射式在线检测在斜面显微镜中的应用
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doi:10.1101/2025.05.30.657110
Prince, Md Nasful Huda; Muthubharathi, Balasubramanian Chellammal; Herath, Wishwa; Sain, Nikhil; Rupam, Md Rafiqul Islam; Bhat, Aadil Qadir; Wani, Adil R; Syed, Mubarak Hussain; Kim, Tae-Hyung; Walker, Mark C; Ponomarova, Olga; Chakraborty, Tonmoy