Routine single particle CryoEM sample and grid characterization by tomography
利用断层扫描技术对常规单颗粒冷冻电镜样品和网格进行表征
期刊:Elife
影响因子:6.4
doi:10.7554/eLife.34257
Noble, Alex J; Dandey, Venkata P; Wei, Hui; Brasch, Julia; Chase, Jillian; Acharya, Priyamvada; Tan, Yong Zi; Zhang, Zhening; Kim, Laura Y; Scapin, Giovanna; Rapp, Micah; Eng, Edward T; Rice, William J; Cheng, Anchi; Negro, Carl J; Shapiro, Lawrence; Kwong, Peter D; Jeruzalmi, David; des Georges, Amedee; Potter, Clinton S; Carragher, Bridget