Andersen, Brian M; Xia, Junzhe; Epstein, Alan L; Ohlfest, John R; Chen, Wei; Blazar, Bruce R; Pennell, Christopher A; Olin, Michael R

Olin, Michael R; Low, Walter; McKenna, David H; Haines, Stephen J; Dahlheimer, Tambra; Nascene, David; Gustafson, Michael P; Dietz, Allan B; Clark, H Brent; Chen, Wei; Blazar, Bruce; Ohlfest, John R; Moertel, Christopher

Dietz, Wynette M; Skinner, Nicole E B; Hamilton, Sara E; Jund, Michelle D; Heitfeld, Suzanne M; Litterman, Adam J; Hwu, Patrick; Chen, Zhi-Ying; Salazar, Andres M; Ohlfest, John R; Blazar, Bruce R; Pennell, Christopher A; Osborn, Mark J

Muldoon, Leslie L; Alvarez, Jorge I; Begley, David J; Boado, Ruben J; Del Zoppo, Gregory J; Doolittle, Nancy D; Engelhardt, Britta; Hallenbeck, John M; Lonser, Russell R; Ohlfest, John R; Prat, Alexandre; Scarpa, Maurizio; Smeyne, Richard J; Drewes, Lester R; Neuwelt, Edward A

Agarwal, Sagar; Manchanda, Pooja; Vogelbaum, Michael A; Ohlfest, John R; Elmquist, William F

Litterman Adam J, Zellmer David M, Grinnen Karen L, Hunt Matthew A, Dudek Arkadiusz Z, Salazar Andres M, Ohlfest John R

Ohlfest John R, Andersen Brian M, Litterman Adam J, Xia Junzhe, Pennell Christopher A, Swier Lauryn E, Salazar Andres M, Olin Michael R

Lechner, Melissa G; Karimi, Saman S; Barry-Holson, Keegan; Angell, Trevor E; Murphy, Katherine A; Church, Connor H; Ohlfest, John R; Hu, Peisheng; Epstein, Alan L

Andersen, Brian M; Ohlfest, John R

Agarwal, Sagar; Mittapalli, Rajendar K; Zellmer, David M; Gallardo, Jose L; Donelson, Randy; Seiler, Charlie; Decker, Stacy A; Santacruz, Karen S; Pokorny, Jenny L; Sarkaria, Jann N; Elmquist, William F; Ohlfest, John R