RC-Effects on the Oxide of SOI MOSFET under Off-State TDDB Degradation: RF Characterization and Modeling
SOI MOSFET 关态 TDDB 退化下氧化层的 RC 效应：射频特性分析与建模
期刊:Micromachines
影响因子:3
doi:10.3390/mi15020252
Otero-Carrascal, Alan; Chaparro-Ortiz, Dora; Srinivasan, Purushothaman; Huerta, Oscar; Gutiérrez-Domínguez, Edmundo; Torres-Torres, Reydezel
