Fast fit-free analysis of fluorescence lifetime imaging via deep learning
通过深度学习对荧光寿命成像进行快速无拟合分析
期刊:Proceedings of the National Academy of Sciences of the United States of America
影响因子:
doi:10.1073/pnas.1912707116
Jason T Smith, Ruoyang Yao, Nattawut Sinsuebphon, Alena Rudkouskaya, Nathan Un, Joseph Mazurkiewicz, Margarida Barroso, Pingkun Yan, Xavier Intes