Surface deep profile synchrotron studies of mechanically modified top-down silicon nanowires array using ultrasoft X-ray absorption near edge structure spectroscopy
利用超软X射线吸收近边结构谱对机械改性自上而下硅纳米线阵列进行表面深剖面同步辐射研究
期刊:Scientific Reports
影响因子:3.9
doi:10.1038/s41598-019-44555-y
Turishchev, S Yu; Parinova, E V; Pisliaruk, A K; Koyuda, D A; Yermukhamed, D; Ming, T; Ovsyannikov, R; Smirnov, D; Makarova, A; Sivakov, V
