日期:
2020 年 — 2026 年
2020
2021
2022
2023
2024
2025
2026
影响因子:

Engineering Work Function to Stabilize Metal Oxides in Reactive Hydrogen

利用工程功函数稳定活性氢中的金属氧化物

Rehman, Abdul; van de Kruijs, Robbert W E; van den Beld, Wesley T E; Sturm, Jacobus M; Ackermann, Marcelo

Work-Function-Dependent Reduction of Transition Metal Nitrides in Hydrogen Environments

过渡金属氮化物在氢气环境中的功函数依赖性还原

Rehman, Abdul; van de Kruijs, Robbert W E; van den Beld, Wesley T E; Sturm, Jacobus M; Ackermann, Marcelo

Chemically Stable Group IV-V Transition Metal Carbide Thin Films in Hydrogen Radical Environments

氢自由基环境下化学性质稳定的IV-V族过渡金属碳化物薄膜

Rehman, Abdul; van de Kruijs, Robbert W E; van den Beld, Wesley T E; Sturm, Jacobus M; Ackermann, Marcelo

Chemical Interaction of Hydrogen Radicals (H*) with Transition Metal Nitrides

氢自由基(H*)与过渡金属氮化物的化学相互作用

Rehman, Abdul; van de Kruijs, Robbert W E; van den Beld, Wesley T E; Sturm, Jacobus M; Ackermann, Marcelo

Nb Texture Evolution and Interdiffusion in Nb/Si-Layered Systems

Nb/Si层状体系中Nb织构演变和互扩散

Chandrasekaran, Anirudhan; van de Kruijs, Robbert W E; Sturm, Jacobus M; Bijkerk, Fred

Nanoscale Transition Metal Thin Films: Growth Characteristics and Scaling Law for Interlayer Formation

纳米级过渡金属薄膜:层间形成的生长特性和标度律

Chandrasekaran, Anirudhan; van de Kruijs, Robbert W E; Sturm, Jacobus M; Zameshin, Andrey A; Bijkerk, Fred

Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold

在低于单次损伤阈值的长期自由电子激光照射下,对极紫外(EUV)镜面抗辐射损伤性能进行实验研究

Makhotkin, Igor A; Sobierajski, Ryszard; Chalupský, Jaromir; Tiedtke, Kai; de Vries, Gosse; Störmer, Michael; Scholze, Frank; Siewert, Frank; van de Kruijs, Robbert W E; Milov, Igor; Louis, Eric; Jacyna, Iwanna; Jurek, Marek; Klinger, Dorota; Nittler, Laurent; Syryanyy, Yevgen; Juha, Libor; Hájková, Věra; Vozda, Vojtěch; Burian, Tomáš; Saksl, Karel; Faatz, Bart; Keitel, Barbara; Plönjes, Elke; Schreiber, Siegfried; Toleikis, Sven; Loch, Rolf; Hermann, Martin; Strobel, Sebastian; Nienhuys, Han Kwang; Gwalt, Grzegorz; Mey, Tobias; Enkisch, Hartmut