Pursuing the Diffraction Limit with Nano-LED Scanning Transmission Optical Microscopy
利用纳米LED扫描透射光学显微镜挑战衍射极限
期刊:Sensors
影响因子:3.5
doi:10.3390/s21103305
Moreno, Sergio; Canals, Joan; Moro, Victor; Franch, Nil; Vilà, Anna; Romano-Rodriguez, Albert; Prades, Joan Daniel; Bezshlyakh, Daria D; Waag, Andreas; Kluczyk-Korch, Katarzyna; Auf der Maur, Matthias; Di Carlo, Aldo; Krieger, Sigurd; Geleff, Silvana; Diéguez, Angel