Electron-Beam Excited Conductive Atomic Force Microscopy for Back Contact Free, Wafer-Scale and In-Line Compatible Electrical Characterization of 2D Materials
用于二维材料无背接触、晶圆级和在线兼容电学表征的电子束激发导电原子力显微镜
期刊:Advanced Science
影响因子:14.1
doi:10.1002/advs.202505113
Laskar, Md Ashiqur Rahman; Ahmed, Sakib; Tummala, Pinakapani; Molle, Alessandro; Lamperti, Alessio; Sailus, Renee; Botros, Youssry Y; Pesic, Milan; Davenport, Rob; Novotný, Ondřej; Neuman, Jan; Toia, Fabrizio; Esqueda, Ivan Sanchez; Tongay, Seth Ariel; Celano, Umberto
