日期:
2020 年 — 2026 年
2020
2021
2022
2023
2024
2025
2026
影响因子:

Effect of Rising Time on AC Stress-Induced Performance Degradation in a-ITGZO Thin-Film Transistors

上升时间对非晶氧化铟镓锌薄膜晶体管交流应力诱导性能退化的影响

Kang, Mingu; Cho, Kyoungah; Kim, Sangsig

Temperature-Dependent Feedback Operations of Triple-Gate Field-Effect Transistors

三栅场效应晶体管的温度相关反馈操作

Park, Taeho; Cho, Kyoungah; Kim, Sangsig

Generation and Storage of Random Voltage Values via Ring Oscillators Comprising Feedback Field-Effect Transistors

利用包含反馈场效应晶体管的环形振荡器生成和存储随机电压值

Son, Jaemin; Jeon, Juhee; Cho, Kyoungah; Kim, Sangsig

Read Operation Mechanism of Feedback Field-Effect Transistors with Quasi-Nonvolatile Memory States

具有准非易失性存储状态的反馈场效应晶体管的读取操作机制

Jeon, Juhee; Cho, Kyoungah; Kim, Sangsig

Binary and ternary logic-in-memory using nanosheet feedback field-effect transistors with triple-gated structure

利用具有三栅结构的纳米片反馈场效应晶体管实现二进制和三元存储器逻辑

Han, Jongseong; Son, Jaemin; Ryu, Seungho; Cho, Kyoungah; Kim, Sangsig

Binarized neural network of diode array with high concordance to vector-matrix multiplication

二极管阵列二值化神经网络与向量矩阵乘法具有高度一致性

Shin, Yunwoo; Cho, Kyoungah; Kim, Sangsig

Effect of interface defects on electrical characteristics of a-ITGZO TFTs under bottom, top, and dual gatings

界面缺陷对底部、顶部和双栅极下a-ITGZO TFT电学特性的影响

Kang, Mingu; Cho, Kyoungah; Seol, Minhyeok; Kim, Sangsub; Kim, Sangsig

Prediction of Device Characteristics of Feedback Field-Effect Transistors Using TCAD-Augmented Machine Learning

基于TCAD增强机器学习的反馈场效应晶体管器件特性预测

Woo, Sola; Jeon, Juhee; Kim, Sangsig

Disturbance Characteristics of 1T DRAM Arrays Consisting of Feedback Field-Effect Transistors

由反馈场效应晶体管组成的1T DRAM阵列的干扰特性

Jeon, Juhee; Cho, Kyoungah; Kim, Sangsig

Neural oscillation of single silicon nanowire neuron device with no external bias voltage

单根硅纳米线神经元器件在无外部偏置电压下的神经振荡

Woo, Sola; Kim, Sangsig