日期 影响因子
日期:
2020 年 — 2026 年
2020
2021
2022
2023
2024
2025
2026
影响因子:
–

Onsager-Casimir frustration from resistance anisotropy in graphene quantum Hall devices

石墨烯量子霍尔器件中电阻各向异性引起的昂萨格-卡西米尔效应挫折

期刊:Physical Review B
影响因子:3.7
doi:10.1103/physrevb.104.085418
Hu, I-Fan; Panna, Alireza R; Rigosi, Albert F; Kruskopf, Mattias; Patel, Dinesh K; Liu, Chieh-I; Saha, Dipanjan; Payagala, Shamith U; Newell, David B; Jarrett, Dean G; Liang, Chi-Te; Elmquist, Randolph E
发表日期：2021
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Metrological Suitability of Functionalized Epitaxial Graphene

功能化外延石墨烯的计量学适用性

期刊:IEEE Transactions on Instrumentation and Measurement
影响因子:5.9
doi:10.1109/CPEM49742.2020.9191783
Rigosi, Albert F; Kruskopf, Mattias; Panna, Alireza R; Payagala, Shamith U; Jarrett, Dean G; Newell, David B; Elmquist, Randolph E
发表日期：2020
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Superconducting Contact Geometries for Next-Generation Quantized Hall Resistance Standards

用于下一代量子化霍尔电阻标准的超导接触几何结构

期刊:IEEE Transactions on Instrumentation and Measurement
影响因子:5.9
doi:10.1109/CPEM49742.2020.9191753
Panna, Alireza R; Kruskopf, Mattias; Rigosi, Albert F; Marzano, Martina; Patel, Dinesh K; Payagala, Shamith U; Jarrett, Dean G; Newell, David B; Elmquist, Randolph E
发表日期：2020
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Comparison between Graphene and GaAs Quantized Hall Devices with a Dual Probe

利用双探针比较石墨烯和GaAs量子化霍尔器件

期刊:IEEE Transactions on Instrumentation and Measurement
影响因子:5.9
doi:10.1109/tim.2020.3004678
Payagala, Shamith U; Rigosi, Albert F; Panna, Alireza R; Pollarolo, Alessio; Kruskopf, Mattias; Schlamminger, Stephan; Jarrett, Dean G; Brown, Ryan; Elmquist, Randolph E; Brown, Duane; Newell, David B
发表日期：2020
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Advanced Temperature-Control Chamber for Resistance Standards

用于电阻标准的高级温控箱

期刊:Journal of Research of the National Institute of Standards and Technology
影响因子:1.3
doi:10.6028/jres.125.012
Payagala, Shamith U; Panna, Alireza R; Rigosi, Albert F; Jarrett, Dean G
发表日期：2020
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Comparison of Multiple Methods for Obtaining PΩ Resistances with Low Uncertainties

多种获取PΩ电阻值且不确定度低的方法的比较

期刊:IEEE Transactions on Instrumentation and Measurement
影响因子:5.9
doi:10.1109/tim.2019.2941036
Yu, Kwang Min; Jarrett, Dean G; Rigosi, Albert F; Payagala, Shamith U; Kraft, Marlin E
发表日期：2019
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Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards

用于台式和高电流量子化霍尔电阻标准的石墨烯器件

期刊:IEEE Transactions on Instrumentation and Measurement
影响因子:5.9
doi:10.1109/TIM.2018.2882958
Rigosi, Albert F; Panna, Alireza R; Payagala, Shamith U; Kruskopf, Mattias; Kraft, Marlin E; Jones, George R; Wu, Bi-Yi; Lee, Hsin-Yen; Yang, Yanfei; Hu, Jiuning; Jarrett, Dean G; Newell, David B; Elmquist, Randolph E
发表日期：2018
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