Current-Induced Evolving Mechanical Properties, Formation of Defects, and Interfacial Intermetallic Growth in the Interconnects Bonded with Au Wire
电流诱导下金线互连线的机械性能演变、缺陷形成和界面金属间化合物生长
期刊:ACS Applied Materials & Interfaces
影响因子:8.2
doi:10.1021/acsami.5c03751
Yuan, Xiaohong; He, Qinlian; Wang, Xiaojing; Zhang, Jiaheng; Yang, Dapeng; Bi, Qinsong; Luo, Yuxi; Chen, Dengquan; Zheng, Shanju; Ebaid, Manal S; Algadi, Hassan; Guo, Zhanhu