Reducing Interface Traps with High Density Hydrogen Treatment to Increase Passivated Emitter Rear Contact Cell Efficiency
利用高密度氢处理减少界面陷阱以提高钝化发射极背接触电池效率
期刊:Nanoscale Research Letters
影响因子:
doi:10.1186/s11671-019-3216-3
Yang, Chih-Cheng; Chen, Po-Hsun; Chang, Ting-Chang; Su, Wan-Ching; Chen, Sung-Yu; Liu, Shui-Chin; Chou, Sheng-Yao; Tan, Yung-Fang; Lin, Chun-Chu; Wu, Pei-Yu; Tsai, Tsung-Ming; Huang, Hui-Chun