Probing the Surface Charge on the Basal Planes of Kaolinite Particles with High-Resolution Atomic Force Microscopy
利用高分辨率原子力显微镜探测高岭石颗粒基面上的表面电荷
期刊:Langmuir
影响因子:3.9
doi:10.1021/acs.langmuir.7b03153
Kumar, N; Andersson, M P; van den Ende, D; Mugele, F; Siretanu, I
