Electronic threshold switching of As-embedded SiO(2) selectors: charged oxygen vacancy model
砷嵌入SiO₂选择器的电子阈值开关:带电氧空位模型
期刊:Nano Convergence
影响因子:11
doi:10.1186/s40580-025-00480-7
Kim, Hye Rim; Seok, Tae Jun; Ha, Tae Jung; Song, Jeong Hwan; Dae, Kyun Seong; Lee, Sang Gil; Choi, Hyun Seung; Park, Su Yong; Choi, Byung Joon; Jang, Jae Hyuck; Kim, Soo Gil; Park, Tae Joo