Genome-Wide Association Study Using High-Density SNP Chip Markers Revealed Novel Bacterial Panicle Blight (Burkholderia glumae) Resistance Genes in Rice
利用高密度SNP芯片标记进行的全基因组关联分析揭示了水稻中新的细菌性穗枯病(伯克霍尔德氏菌)抗性基因。
期刊:Plant Pathology Journal
影响因子:2.5
doi:10.5423/PPJ.OA.07.2025.0089
Jang, Seong-Gyu; Jo, Sumin; Lee, Sais-Beul; Kim, Ji-Min; Kabange, Nkulu Rolly; Lee, Duyoung; Park, So-Yeon; Choi, Haeun; Kang, Ju-Won; Lee, So-Myeong; Kwon, Youngho; Choi, Jisu; Jeong, Jong-Min; Seo, Young-Su; Kwon, Soon-Wook; Lee, Jong-Hee; Park, Dong-Soo