α -event characterization and rejection in point-contact HPGe detectors
点接触式高纯锗探测器中α事件的特征分析与剔除
期刊:European Physical Journal C
影响因子:4.8
doi:10.1140/epjc/s10052-022-10161-y
Arnquist, I J; Avignone, F T 3rd; Barabash, A S; Barton, C J; Bertrand, F E; Blalock, E; Bos, B; Busch, M; Buuck, M; Caldwell, T S; Chan, Y-D; Christofferson, C D; Chu, P-H; Clark, M L; Cuesta, C; Detwiler, J A; Drobizhev, A; Edwards, T R; Edwins, D W; Edzards, F; Efremenko, Y; Elliott, S R; Gilliss, T; Giovanetti, G K; Green, M P; Gruszko, J; Guinn, I S; Guiseppe, V E; Haufe, C R; Hegedus, R J; Henning, R; Aguilar, D Hervas; Hoppe, E W; Hostiuc, A; Kim, I; Kouzes, R T; Lopez, A M; López-Castaño, J M; Martin, E L; Martin, R D; Massarczyk, R; Meijer, S J; Mertens, S; Myslik, J; Oli, T K; Othman, G; Pettus, W; Poon, A W P; Radford, D C; Rager, J; Reine, A L; Rielage, K; Ruof, N W; Saykı, B; Schönert, S; Stortini, M J; Tedeschi, D; Varner, R L; Vasilyev, S; Wilkerson, J F; Willers, M; Wiseman, C; Xu, W; Yu, C-H; Zhu, B X
