Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits
利用谐振微波电路测量微米级材料中的载流子寿命
期刊:Nature Communications
影响因子:15.7
doi:10.1038/s41467-019-09602-2
Dev, Sukrith; Wang, Yinan; Kim, Kyounghwan; Zamiri, Marziyeh; Kadlec, Clark; Goldflam, Michael; Hawkins, Samuel; Shaner, Eric; Kim, Jin; Krishna, Sanjay; Allen, Monica; Allen, Jeffery; Tutuc, Emanuel; Wasserman, Daniel
