Electronic trap detection with carrier-resolved photo-Hall effect
利用载流子分辨光霍尔效应进行电子陷阱检测
期刊:Science Advances
影响因子:12.5
doi:10.1126/sciadv.adz0460
Gunawan, Oki; Kim, Chaeyoun; Nainggolan, Bonfilio; Lee, Minyeul; Shin, Jonghwa; Kim, Dong Suk; Jo, Yimhyun; Kim, Minjin; Euvrard, Julie; Bishop, Douglas; Libsch, Frank; Todorov, Teodor; Kim, Yunna; Shin, Byungha