Damage Mechanism Analysis of High Field Stress on Cascode GaN HEMT Power Devices
高场应力对共源共栅GaN HEMT功率器件的损伤机理分析
期刊:Micromachines
影响因子:3
doi:10.3390/mi16070729
Su, Shuo; Cao, Yanrong; Zhang, Weiwei; Zhang, Xinxiang; Chen, Chuan; Wu, Linshan; Zhang, Zhixian; Li, Miaofen; Lv, Ling; Zheng, Xuefeng; Tian, Wenchao; Ma, Xiaohua; Hao, Yue