Femtosecond electronic structure response to high intensity XFEL pulses probed by iron X-ray emission spectroscopy
利用铁X射线发射光谱探测飞秒电子结构对高强度XFEL脉冲的响应
期刊:Scientific Reports
影响因子:3.9
doi:10.1038/s41598-020-74003-1
Alonso-Mori, Roberto; Sokaras, Dimosthenis; Cammarata, Marco; Ding, Yuantao; Feng, Yiping; Fritz, David; Gaffney, Kelly J; Hastings, Jerome; Kao, Chi-Chang; Lemke, Henrik T; Maxwell, Timothy; Robert, Aymeric; Schropp, Andreas; Seiboth, Frank; Sikorski, Marcin; Song, Sanghoon; Weng, Tsu-Chien; Zhang, Wenkai; Glenzer, Siegfried; Bergmann, Uwe; Zhu, Diling