日期:
2020 年 — 2026 年
2020
2021
2022
2023
2024
2025
2026
影响因子:

Simulations of dislocation contrast in dark-field X-ray microscopy

暗场X射线显微镜中位错对比度的模拟

Borgi, Sina; Ræder, Trygve Magnus; Carlsen, Mads Allerup; Detlefs, Carsten; Winther, Grethe; Poulsen, Henning Friis

Real-time imaging of acoustic waves in bulk materials with X-ray microscopy

利用X射线显微镜对块状材料中的声波进行实时成像

Holstad, Theodor S; Dresselhaus-Marais, Leora E; Ræder, Trygve Magnus; Kozioziemski, Bernard; Driel, Tim van; Seaberg, Matthew; Folsom, Eric; Eggert, Jon H; Knudsen, Erik Bergbäck; Nielsen, Martin Meedom; Simons, Hugh; Haldrup, Kristoffer; Poulsen, Henning Friis

Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

利用X射线自由电子激光器同时进行明场和暗场X射线显微镜成像

Dresselhaus-Marais, Leora E; Kozioziemski, Bernard; Holstad, Theodor S; Ræder, Trygve Magnus; Seaberg, Matthew; Nam, Daewoong; Kim, Sangsoo; Breckling, Sean; Choi, Sungwook; Chollet, Matthieu; Cook, Philip K; Folsom, Eric; Galtier, Eric; Gonzalez, Arnulfo; Gorkhover, Tais; Guillet, Serge; Haldrup, Kristoffer; Howard, Marylesa; Katagiri, Kento; Kim, Seonghan; Kim, Sunam; Kim, Sungwon; Kim, Hyunjung; Knudsen, Erik Bergbäck; Kuschel, Stephan; Lee, Hae Ja; Lin, Chuanlong; McWilliams, R Stewart; Nagler, Bob; Nielsen, Martin Meedom; Ozaki, Norimasa; Pal, Dayeeta; Pablo Pedro, Ricardo; Saunders, Alison M; Schoofs, Frank; Sekine, Toshimori; Simons, Hugh; van Driel, Tim; Wang, Bihan; Yang, Wenge; Yildirim, Can; Poulsen, Henning Friis; Eggert, Jon H