Effects of Poly-Si Grain Boundary on Retention Characteristics under Cross-Temperature Conditions in 3-D NAND Flash Memory
多晶硅晶界对三维NAND闪存在跨温条件下的数据保持特性的影响
期刊:Micromachines
影响因子:3
doi:10.3390/mi14122199
An, Ukju; Yoon, Gilsang; Go, Donghyun; Park, Jounghun; Kim, Donghwi; Kim, Jongwoo; Lee, Jeong-Soo
