Correction to Electrostatic Discovery Atomic Force Microscopy
静电发现原子力显微镜的更正
期刊:ACS Nano
影响因子:16
doi:10.1021/acsnano.2c08130
Oinonen, Niko; Xu, Chen; Alldritt, Benjamin; Hapala, Prokop; Canova, Filippo Federici; Urtev, Fedor; Cai, Shuning; Krejčí, Ondřej; Kannala, Juho; Liljeroth, Peter; Foster, Adam S