Author Correction: On the longevity and inherent hermeticity of silicon-ICs: evaluation of bare-die and PDMS-coated ICs after accelerated aging and implantation studies
作者更正:关于硅集成电路的寿命和固有密封性:加速老化和注入研究后裸芯片和PDMS涂层集成电路的评估
期刊:Nature Communications
影响因子:15.7
doi:10.1038/s41467-025-57175-0
Nanbakhsh, Kambiz; Shah Idil, Ahmad; Lamont, Callum; Dücső, Csaba; Akgun, Ömer Can; Horváth, Domonkos; Tóth, Kinga; Meszéna, Domokos; Ulbert, István; Mazza, Federico; Constandinou, Timothy G; Serdijn, Wouter; Vanhoestenberghe, Anne; Donaldson, Nick; Giagka, Vasiliki