Multi-order Scaling of High-throughput Transmission Electron Microscopy
高通量透射电子显微镜的多阶标度
期刊:Microscopy and Microanalysis
影响因子:3
doi:10.1017/s1431927619005932
Own, Christopher S; DeRego, Theodore; Own, Lawrence S; Weppelman, Gerward; Wanner, Adrian A; Ströh, Sebastian; Hammerschmith, Eric; Vishwanathan, Ashwin; Seung, H Sebastian