Electrically driven optical interferometry with spins in silicon carbide
利用碳化硅中的自旋进行电驱动光学干涉测量
期刊:Science Advances
影响因子:12.5
doi:10.1126/sciadv.aay0527
Miao, Kevin C; Bourassa, Alexandre; Anderson, Christopher P; Whiteley, Samuel J; Crook, Alexander L; Bayliss, Sam L; Wolfowicz, Gary; Thiering, Gergő; Udvarhelyi, Péter; Ivády, Viktor; Abe, Hiroshi; Ohshima, Takeshi; Gali, Ádám; Awschalom, David D