Probing the edge-related properties of atomically thin MoS(2) at nanoscale
在纳米尺度上探测原子级薄 MoS(2) 的边缘相关性质
期刊:Nature Communications
影响因子:15.7
doi:10.1038/s41467-019-13486-7
Huang, Teng-Xiang; Cong, Xin; Wu, Si-Si; Lin, Kai-Qiang; Yao, Xu; He, Yu-Han; Wu, Jiang-Bin; Bao, Yi-Fan; Huang, Sheng-Chao; Wang, Xiang; Tan, Ping-Heng; Ren, Bin
