A Simplified Cluster Analysis of Electron Track Structure for Estimating Complex DNA Damage Yields
一种用于估算复杂DNA损伤产量的简化电子径迹结构聚类分析方法
期刊:International Journal of Molecular Sciences
影响因子:4.9
doi:10.3390/ijms21051701
Matsuya, Yusuke; Nakano, Toshiaki; Kai, Takeshi; Shikazono, Naoya; Akamatsu, Ken; Yoshii, Yuji; Sato, Tatsuhiko