Revealing interfacial failure mechanism of silicon based all solid state batteries via cryogenic electron microscopy
利用低温电子显微镜揭示硅基全固态电池的界面失效机制
期刊:Nature Communications
影响因子:15.7
doi:10.1038/s41467-025-64697-0
Yao, Jingming; Yu, Zhixuan; Ma, Jun; Ye, Zhangran; Du, Congcong; Zhao, Jun; Chen, Jingzhao; Ye, Hongjun; Dai, Qiushi; Li, Hui; Su, Yong; Yan, Jitong; Zhu, Dingding; Wang, Zaifa; Zhang, Xuedong; Rong, Zhaoyu; Yu, Qiang; Guo, Ziang; Qiu, Hailong; Wang, Zhenyu; Zhu, Lingyun; Tang, Yongfu; Huang, Jianyu