Abstract
Photobleaching is a major factor limiting the observation time in fluorescence microscopy. We achieve photobleaching reduction in structured illumination microscopy (SIM) by locally adjusting the illumination intensities according to the sample. Adaptive SIM is enabled by a digital micro-mirror device (DMD), which provides a projection of the grayscale illumination patterns. We demonstrate a reduction in photobleaching by a factor of three in adaptive SIM compared to the non-adaptive SIM based on a spot grid scanning approach. Our proof-of-principle experiments show great potential for DMD-based microscopes to become a more useful tool in live-cell SIM imaging.