Effect of Ge Nanocrystals on 1.54 μm Photoluminescence Enhancement in Er₂O₃:ZnO and Ge Co-Sputtered Films

锗纳米晶体对 Er₂O₃:ZnO 和 Ge 共溅射薄膜中 1.54 μm 光致发光增强的影响

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Abstract

Photoluminescence (PL) of Er and Ge co-doped ZnO films synthesized by radio frequency magnetron co-sputtering was investigated. X-ray diffraction (XRD) patterns showed that the annealing process at 400-800 °C led to the formation of nanocrystal (nc) Ge. Samples containing nc-Ge showed a strong visible PL with a peak at 582-593 nm, which was consistent with the calculated energy of the exciton of the ~5 nm-sized nc-Ge, according to the quantum confinement effect. The formation of nc-Ge could greatly enhance the 1.54 μm emission, and it is considered that the 1.54 μm PL enhancement may come from a joint effect of both the energy transfer from nc-Ge to Er(3+) and the local environment change of Er(3+).

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