Abstract
Multilayer Ceramic Capacitors (MLCC) have a major role in modern electronic devices due to their small price and size, large range of capacitance, small ESL and ESR, and good frequency response. Unfortunately, the main dielectric material used for MLCCs, Barium Titanate, makes the capacitors vibrate due to the piezoelectric and electrostrictive effects. This vibration is transferred to the PCB, making it resonate in the audible range of 20 Hz-20 kHz, and in this way the singing capacitors phenomenon occurs. This phenomenon is usually measured with a microphone, to measure the sound pressure level, or with a Laser Doppler Vibrometer (LDV), to measure the vibration. Besides this, other methods are mentioned in the literature, for example, the optical fiber and the active excitation method. There are several solutions to attenuate or even eliminate the acoustic noise caused by MLCC. Specially designed capacitors for low acoustic levels and different layout geometries are only two options found in the literature. To prevent the singing capacitor phenomenon, different simulations can be performed, the harmonic analysis being the most popular technique. This paper is an up-to-date review of the acoustic noise caused by MLCCs in electronic devices, containing measurements methodologies, solutions, and simulation methods.