Analysis of the surface plasmon resonance interferometric imaging performance of scanning confocal surface plasmon microscopy

扫描共聚焦表面等离子体显微镜表面等离子体共振干涉成像性能分析

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Abstract

Here, we apply rigorous coupled-wave theory to analyze the optical phase imaging performance of scanning confocal surface plasmon microscope. The scanning confocal surface plasmon resonance microscope is an embedded interferometric microscope interfering between two integrated optical beams. One beam is provided by the central part around the normal incident angle of the back focal plane, and the other beam is the incident angles beyond the critical angle, exciting the surface plasmon. Furthermore, the two beams can form an interference signal inside a confocal pinhole in the image plane, which provides a well-defined path for the surface plasmon propagation. The scanning confocal surface plasmon resonance microscope operates by scanning the sample along the optical axis z, so-called V(z). The study investigates two imaging modes: non-quantitative imaging and quantitative imaging modes. We also propose a theoretical framework to analyze the scanning confocal surface plasmon resonance microscope compared to non-interferometric surface plasmon microscopes and quantify quantitative performance parameters including spatial resolution and optical contrast for non-quantitative imaging; sensitivity and crosstalk for quantitative imaging. The scanning confocal SPR microscope can provide a higher spatial resolution, better sensitivity, and lower crosstalk measurement. The confocal SPR microscope configuration is a strong candidate for high throughput measurements since it requires a smaller sensing channel than the other SPR microscopes.

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