Alternating projection combined with fast gradient projection (FGP-AP) method for intensity-only measurement optical diffraction tomography in LED array microscopy

用于LED阵列显微镜中仅强度测量光学衍射层析成像的交替投影结合快速梯度投影(FGP-AP)方法

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Abstract

Optical diffraction tomography (ODT) is a powerful label-free measurement tool that can quantitatively image the three-dimensional (3D) refractive index (RI) distribution of samples. However, the inherent "missing cone problem," limited illumination angles, and dependence on intensity-only measurements in a simplified imaging setup can all lead to insufficient information mapping in the Fourier domain, affecting 3D reconstruction results. In this paper, we propose the alternating projection combined with the fast gradient projection (FGP-AP) method to compensate for the above problem, which effectively reconstructs the 3D RI distribution of samples using intensity-only images captured from LED array microscopy. The FGP-AP method employs the alternating projection (AP) algorithm for gradient descent and the fast gradient projection (FGP) algorithm for regularization constraints. This approach is equivalent to incorporating prior knowledge of sample non-negativity and smoothness into the 3D reconstruction process. Simulations demonstrate that the FGP-AP method improves reconstruction quality compared to the original AP method, particularly in the presence of noise. Experimental results, obtained from mouse kidney cells and label-free blood cells, further affirm the superior 3D imaging efficacy of the FGP-AP method.

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