Abstract
This paper introduces a novel method for measuring the dielectric permittivity of materials within the microwave and millimeter wave frequency ranges. The proposed approach, classified as a guided wave transmission system, employs a periodic transmission line structure characterized by mirror/glide symmetry. The dielectric permittivity is deduced by measuring the transmission properties of such structure when presence of the dielectric material breaks the inherent symmetry of the structure and consequently introduce a stopband in propagation characteristic. To explore the influence of symmetry breaking on propagation properties, an analytical dispersion equation, for both symmetries, is formulated using the Rigorous Coupled Wave Analysis (RCWA) combined with the matrix transverse resonance condition. Based on the analytical equation, an optimization procedure and linearized model for a sensing structure is obtained, specifically for X-band characterization of FR4 substrates. The theoretical results of the model are validated with full wave simulations and experimentally.