Spectral-resolved cone-beam X-ray luminescence computed tomography with principle component analysis

基于主成分分析的光谱分辨锥束X射线发光计算机断层扫描

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Abstract

Cone-beam X-ray luminescence computed tomography (CB-XLCT) has become a promising technique for its higher utilization of X-ray and shorter scanning time compared to the narrow-beam XLCT, but it suffers from the low-spatial resolution that results in the insufficiency to resolve the adjacent multiple probes. In multispectral CB-XLCT, multiple probes show different emission behaviors in the dimension of the spectrum. In this work, a spectral-resolved CB-XLCT method combining multispectral CB-XLCT with principle component analysis (PCA) was proposed to improve the imaging resolution. Results of digital simulation and the phantom experiment illustrated that the proposed method was capable of resolving adjacent multiple probes accurately and had better performance than the common multispectral CB-XLCT with spectrum information priori.

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