Abstract
Refractive index resolution is an important indicator for a wavelength interrogation surface plasmon resonance sensor, which can be affected by signal-to-noise ratio. This paper investigates the impact of spectral signal-to-noise ratio on a surface plasmon resonance sensor. The effects of different spectral powers and noises are compared and verified through simulation and experiments. The results indicate that the optimal resonance wavelength is changed and the refractive index resolution can even be nearly twice as good when the spectral signal-to-noise ratio is increased. The optimal resonance wavelength can be found by changing the spectral power distribution or noise.