Abstract
Leaf and spike diseases can significantly reduce wheat yield and grain quality. To mitigate these impacts, an integrated disease management approach can be adopted, incorporating measures such as the use of resistant cultivars, fungicides and nitrogen fertilization. This study aimed to evaluate the impact of these practices on chlorophyll a fluorescence, yield components, and the technological quality of wheat grains. The area under the disease progress curve (AUDPC) was correlated with the maximum efficiency of photosystem II (PSII) photochemistry (F(v)/F(m)), as measured at the dough development stage (ZGS80) under field conditions, which also affected quality parameters. Additionally, an increase in AUDPC values reduced the thousand kernel weight (TKW) and test weight (TW). Conversely, AUDPC values for tan spot, powdery mildew and leaf rust were positively related to ash content (affecting flour color), protein content (PC) and grain falling number. Both the recommended nitrogen rate (130 kg ha(-1)) and the high rate (200 kg ha(-1)) increased grain protein content (PC) and gluten index (GI), while maintaining dough stability and water absorption. Fungicide application increased flour lightness and yellowness. Overall, integrated disease management combining moderately resistant cultivars, fungicide applications and nitrogen fertilization reduced AUDPC values, increased F(v)/F(m) (indicating optimal physiological performance) and ensured yield components and maintenance of wheat technological quality.