Abstract
Accurately controlling the mechanical properties of silicon is essential for developing high-performance micro-devices and systems. In this study, we investigate the influence of phosphorus doping on the elastic constants of silicon across a wide temperature range using a combination of tight-binding simulations and deformation potential theory. The mechanical properties were derived using Keyes's framework integrated with Fermi-Dirac statistics. The Goodwin-Skinner-Pettifor functional form was applied to estimate dopant-induced stress potentials and their effect on lattice stiffness. In particular, we investigated the change in elastic constants and their temperature dependence under ultra-high doping concentrations. The results show a monotonic decrease in c(11) and a non-monotonic increase in c(12) with both temperature and doping, while c(44) remains relatively unaffected, consistent with experimental and theoretical studies. These changes are attributed to anisotropic carrier redistribution among conduction band valleys and strain-modulated interactions between valleys. The novelty of this work lies in the explicit, atomistically informed calculation of deformation potential constants using tight-binding parameters specific to phosphorus doping in silicon, enabling the accurate prediction of temperature-dependent elastic constants and anisotropic mechanical behaviour in emerging microsystem applications.