Realizing High Thermoelectric Performance at Ambient Temperature by Ternary Alloying in Polycrystalline Si(1-x-y)Ge(x)Sn(y) Thin Films with Boron Ion Implantation

通过硼离子注入在多晶Si(1-xy)Ge(x)Sn(y)薄膜中实现三元合金化,从而在室温下实现高热电性能

阅读:1

Abstract

The interest in thermoelectrics (TE) for an electrical output power by converting any kind of heat has flourished in recent years, but questions about the efficiency at the ambient temperature and safety remain unanswered. With the possibility of integration in the technology of semiconductors based on silicon, highly harvested power density, abundant on earth, nontoxicity, and cost-efficiency, Si(1-x-y)Ge(x)Sn(y) ternary alloy film has been investigated to highlight its efficiency through ion implantation and high-temperature rapid thermal annealing (RTA) process. Significant improvement of the ambient-temperature TE performance has been achieved in a boron-implanted Si(0.864)Ge(0.108)Sn(0.028) thin film after a short time RTA process at 1100 °C for 15 seconds, the power factor achieves to 11.3 μWcm(-1) K(-2) at room temperature. The introduction of Sn into Si(1-x)Ge(x) dose not only significantly improve the conductivity of Si(1-x)Ge(x) thermoelectric materials but also achieves a relatively high Seebeck coefficient at room temperature. This work manifests emerging opportunities for modulation Si integration thermoelectrics as wearable devices charger by body temperature.

特别声明

1、本页面内容包含部分的内容是基于公开信息的合理引用;引用内容仅为补充信息,不代表本站立场。

2、若认为本页面引用内容涉及侵权,请及时与本站联系,我们将第一时间处理。

3、其他媒体/个人如需使用本页面原创内容,需注明“来源:[生知库]”并获得授权;使用引用内容的,需自行联系原作者获得许可。

4、投稿及合作请联系:info@biocloudy.com。