Abstract
Using soft X-ray (SX) spectromicroscopy, we show maps of the spatial distribution of constituent elements and local analysis of the density of states (DOS) related to the element-specific chemical states of diatom frustules, which are composed of naturally grown nanostructured hydrogenated amorphous silica. We applied X-ray photoemission electron microscopy (X-PEEM) as well as microprobe X-ray fluorescence (μXRF) analysis to characterize the surfaces of diatom frustules by means of X-ray absorption spectroscopy (XAS) and X-ray emission spectroscopy (XES). We successfully demonstrated that SX spectromicroscopy is able to participate in potential observation tools as a new method to spectroscopically investigate diatom frustules.