Tendency in tip polarity changes in non-contact atomic force microscopy imaging on a fluorite surface

非接触式原子力显微镜成像中萤石表面探针极性变化的趋势

阅读:1

Abstract

We investigate the impact of tip changes on atomic-scale non-contact atomic force microscopy (NC-AFM) contrast formation when imaging a CaF(2)(111) surface. A change of the atomic contrast is explained by a polarity change of the tip-terminating cluster or by a polarity-preserving tip change via the re-arrangement of the foremost atoms. Based on the established understanding of the unique contrast patterns on CaF(2)(111), polarity-preserving and polarity-changing tip changes can be identified unambiguously. From analyzing a large set of images, we find that the vast majority of tip changes tend to result in negative tip termination. This analysis delivers hints for tip configurations suitable for stable imaging of CaF(2)(111) surfaces.

特别声明

1、本页面内容包含部分的内容是基于公开信息的合理引用;引用内容仅为补充信息,不代表本站立场。

2、若认为本页面引用内容涉及侵权,请及时与本站联系,我们将第一时间处理。

3、其他媒体/个人如需使用本页面原创内容,需注明“来源:[生知库]”并获得授权;使用引用内容的,需自行联系原作者获得许可。

4、投稿及合作请联系:info@biocloudy.com。