Abstract
The local stress state and microstructure near the crack-tip singularity control the fracture process. In ductile materials multiple toughening mechanisms are at play that dynamically influence stress and microstructure at the crack tip. In metals, crack-tip shielding is typically associated with the emission of dislocations. Therefore, to understand crack propagation on the most fundamental level, in situ techniques are required that are capable to combine imaging and stress mapping at high resolution. Recent experimental advances in x-ray diffraction, scanning electron microscopy, and transmission electron microscopy enable quantifying deformation stress fields from the bulk level down to the individual dislocation. Furthermore, through modern detector technology the temporal resolution has sufficiently improved to enable stress mapping during in situ experiments.