Abstract
A snapshot multi-wavelength interference microscope is proposed for high-speed measurement of large vertical range discontinuous microstructures and surface roughness. A polarization CMOS camera with a linear micro-polarizer array and Bayer filter accomplishes snapshot multi-wavelength phase-shifting measurement. Four interferograms with 𝜋/2 phase shift are captured at each wavelength for phase measurement, the 2𝜋 ambiguities are removed by using two or three wavelengths.