Abstract
Increasing demands for precision electronics require individual components such as resistors to be specified, as they can be the limiting factor within a circuit. To specify quality and long-term stability of resistors, noise measurements are a common method. This review briefly explains the theoretical background, introduces the noise index and provides an insight on how this index can be compared to other existing parameters. It then focuses on the different methods to measure excess noise in resistors. The respective advantages and disadvantages are pointed out in order to simplify the decision of which setup is suitable for a particular application. Each method is analyzed based on the integration of the device under test, components used, shielding considerations and signal processing. Furthermore, our results on the excess noise of resistors and resistor networks are presented using two different setups, one for very low noise measurements down to 20 µHz and one for broadband up to 100 kHz. The obtained data from these measurements are then compared to published data. Finally, first measurements on commercial strain gauges and inkjet-printed strain gauges are presented that show an additional 1/f(α) component compared to commercial resistors and resistor networks.